Tip Coupling and Array Effects of Gold Nanoantennas in Near-Field Microscopy
نویسندگان
چکیده
منابع مشابه
Tip-enhanced near-field optical microscopy.
Spectroscopic methods with high spatial resolution are essential for understanding the physical and chemical properties of nanoscale materials, including quantum structures and biological surfaces. An optical technique is reviewed that relies on the enhanced electric fields in the proximity of a sharp, laser-irradiated metal tip. These fields are utilized for spatially confined probing of vario...
متن کاملApertureless near-field optical microscopy: Tip–sample coupling in elastic light scattering
For linear light scattering in apertureless scanning near-field optical microscopy, we have studied the correlations between the tip radius of the probe, signal strength, spatial resolution, and sample material. Pronounced variations of the near-field distance dependence on tip shape and dielectric function of the sample are observed. For very sharp metal tips, the scattered near-field signal d...
متن کاملPlasmon-coupled tip-enhanced near-field optical microscopy.
Near the cut-off radius of a guided waveguide mode of a metal-coated glass fibre tip it is possible to couple radiation to surface plasmons propagating on the outside surface of the metal coating. These surface plasmons converge toward the apex of the tip and interfere constructively for particular polarization states of the initial waveguide mode. Calculations show that a radially polarized wa...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: ACS Photonics
سال: 2021
ISSN: ['2330-4022']
DOI: https://doi.org/10.1021/acsphotonics.1c00744